Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX ...
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin fil...