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    Material Science & Nanotechnology

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    All Products of Material Characterisation

    Park FX40 - Atomic Force Microscope

    Park FX40 - Atomic Force Microscope

    Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX ...
    Pricing & Availability Download Catalogue Add to wishlist Park Systems
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    ColorCube - Stationary Spectrophotometer

    ColorCube - Stationary Spectrophotometer

    The simplest solution for the laboratory – with single button operation
    Pricing & Availability Download Catalogue Add to wishlist ColorLite
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    ColorTube - Stationary Spectrophotometer

    ColorTube - Stationary Spectrophotometer

    The High-End solution with unique features setting it apart from the rest
    Pricing & Availability Download Catalogue Add to wishlist ColorLite
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    sph RG2 - Portable Spectrophotometer

    sph RG2 - Portable Spectrophotometer

    Made from solid materials – Spectrophotometer with highest protection class
    Pricing & Availability Download Catalogue Add to wishlist ColorLite
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    sph xs1 - Portable Spectrophotometer

    sph xs1 - Portable Spectrophotometer

    The ultra mobile compact solution – Easy Colour and 60° gloss measurement
    Pricing & Availability Download Catalogue Add to wishlist ColorLite
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    Densitometer sd350

    Densitometer sd350

    The market leader for highest accuracy and precision
    Pricing & Availability Download Catalogue Add to wishlist ColorLite
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    Park NX20 - Complete AFM System

    Park NX20 - Complete AFM System

    Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
    Pricing & Availability Download Catalogue Add to wishlist Park Systems
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    Park NX-Wafer - Atomic Force Microscope

    Park NX-Wafer - Atomic Force Microscope

    Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
    Pricing & Availability Download Catalogue Add to wishlist Park Systems
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    TT-AFM  - Atomic Force Micrioscope

    TT-AFM - Atomic Force Micrioscope

    This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
    Pricing & Availability Download Catalogue Add to wishlist AFM Workshop
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    NP-AFM - Atomic Force Microscope

    NP-AFM - Atomic Force Microscope

    The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
    Pricing & Availability Download Catalogue Add to wishlist AFM Workshop
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    SA-AFM - Atomic Force Microscope

    SA-AFM - Atomic Force Microscope

    The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
    Pricing & Availability Download Catalogue Add to wishlist AFM Workshop
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    Phenom ProX G6 Desktop SEM

    Phenom ProX G6 Desktop SEM

    Desktop SEM with EDS capability for robust, effortless, and versatile elemental analysis
    Pricing & Availability Download Catalogue Add to wishlist Thermo Fisher Scientific
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    The MProbe 20 Series: Thin Film Thickness Measurement System

    The MProbe 20 Series: Thin Film Thickness Measurement System

    The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
    Pricing & Availability Download Catalogue Add to wishlist Semiconsoft
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    The MProbe 40: MSP  Thin Film Measurement System

    The MProbe 40: MSP Thin Film Measurement System

    he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
    Pricing & Availability Add to wishlist Semiconsoft
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    TF Lab 4040 - Non-contact Sheet Resistivity Meter

    TF Lab 4040 - Non-contact Sheet Resistivity Meter

    The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin fil...
    Pricing & Availability Download Catalogue Add to wishlist Suragus
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    Material Characterisation
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