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Material Characterisation
Atomic Force Microscope
Park FX40 - Atomic Force Microscope
Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX ...
010-0020 NX10 Complete AFM System
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and ...
002-000 NX20 Complete AFM System
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
NX-Wafer - Atomic Force Microscope
Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
NX BIO - Atomic Force Microscope
Park NX-Bio enables that with its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM) and its highly acclaimed Atomic Force Microscopy (AFM) technology.
TT-AFM - Atomic Force Micrioscope
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
NP-AFM - Atomic Force Microscope
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
SA-AFM - Atomic Force Microscope
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- Photoelectrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Mortar Grinder
- Planetary Ball Mill
- Battery & Cell Test Equipment
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Dual Rate Syringe Pump
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Raman Spectrometer
- Syringe Pump
- Thermal Analyzer
- Nitrogen Dry Glovebox
- Controlled Atmosphere/Anaerobic Chamber
- Oven
- Ashing Furnace
- Muffle Furnace
- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Raman Measurement System
- Glove Box
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- Plasma-assisted MOCVD System
- RIE System
- Thermal Evaporation system
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder &Polisher
- Rapid Thermal Process Equipment
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope(SEM)
- Differencial Scanning Calorimeter
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Zeta Potential Analyser
- Molecular Weight Analyser
- Differential Refractometer
- Research Goniometer and Laser Light Scattering System
- Quantitative Cathodoluminescence
- Nanometer Resolution Spectroscopy Instrument
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- RAMAN Spectroscopic Analysis
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar simulators
- SMU systems
- Active loads
- Sample holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
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