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Material Characterisation
Atomic Force Microscope
Park NX20 Lite - Atomic Force Microscope
The most affordable AFM system for water measurement and analysis with latest NX performance
Park NX7 - Atomic Force Microscope
The affordable choice for the first step AFM research with the latest NX components
Park NX12 - Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities
Park FX40 - Atomic Force Microscope
Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX ...
Park NX10 - Atomic Force Microscope
The premiere choice for nanotechnology research
Park NX20 - Complete AFM System
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
Park NX-Wafer - Atomic Force Microscope
Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
TT-AFM - Atomic Force Micrioscope
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
NP-AFM - Atomic Force Microscope
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
SA-AFM - Atomic Force Microscope
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- Photoelectrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Mortar Grinder
- Planetary Ball Mill
- Battery & Cell Test Equipment
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Dual Rate Syringe Pump
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Raman Spectrometer
- Syringe Pump
- Thermal Analyzer
- Nitrogen Dry Glovebox
- Controlled Atmosphere/Anaerobic Chamber
- Oven
- Ashing Furnace
- Muffle Furnace
- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Raman Measurement System
- Glove Box
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
- Hardness Tester
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- Plasma-assisted MOCVD System
- RIE System
- Thermal Evaporation system
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder &Polisher
- Rapid Thermal Process Equipment
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope(SEM)
- Differencial Scanning Calorimeter
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Zeta Potential Analyser
- Molecular Weight Analyser
- Differential Refractometer
- Research Goniometer and Laser Light Scattering System
- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- RAMAN Spectroscopic Analysis
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar simulators
- SMU systems
- Active loads
- Sample holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
- Dipping Probes
- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
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