All Products of Material Characterisation

010-0020 NX10 Complete AFM System

010-0020 NX10 Complete AFM System

ark NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and b...
002-000 NX20 Complete AFM System

002-000 NX20 Complete AFM System

Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
NX-Wafer - Atomic Force Microscope

NX-Wafer - Atomic Force Microscope

Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
NX BIO - Atomic Force Microscope

NX BIO - Atomic Force Microscope

Park NX-Bio enables that with its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM) and its highly acclaimed Atomic Force Microscopy (AFM) technology.
TT-AFM  - Atomic Force Micrioscope

TT-AFM - Atomic Force Micrioscope

This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
NP-AFM - Atomic Force Microscope

NP-AFM - Atomic Force Microscope

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
SA-AFM - Atomic Force Microscope

SA-AFM - Atomic Force Microscope

The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
Phenom Pro- Scanning Electron Microscope

Phenom Pro- Scanning Electron Microscope

The Phenom Pro is Phenom-World's high-end imaging desktop SEM. In combination with a large range of sample holders and automated system software, it can be tailored to suit a multitude of applications.
STA PT1600  -STA Simultaneous Thermal Analysis

STA PT1600 -STA Simultaneous Thermal Analysis

The STA PT1600 is the high end Simultaneous Thermobalance from LINSEIS. The system offers unparalleled TG and DSC resolution in combination with the highest vacuum capabilities and TG drift stability. The system is modular with ma...
  LFA 1000 Laser Flash Apparatus

LFA 1000 Laser Flash Apparatus

The Linseis LFA 1000 Laser Flash is the most modular and precise Instrument for the determination of Thermal Diffusivity, Conductivity and Specific Heat Values. Its sample robot for up to 6 Samples at the same time allows unbeaten...
LZT-Meter  - Seeback Coefficient & Electric Resistivity Unit

LZT-Meter - Seeback Coefficient & Electric Resistivity Unit

The first commercial instrument worldwide to measure the Figure of Merit in only one measurement (combining LSR and LFA).
Grammont 2172 - Nanometer Resolution Spectroscopy Instrument

Grammont 2172 - Nanometer Resolution Spectroscopy Instrument

The Grammont 2172 is a nanometer resolution spectroscopy instrument, based on a disruptive technology called Quantitative Cathodoluminescence, that tightly integrates a scanning electron microscope and a light microscope into one ...
Allalin 4027 Chronos - Quantitative Cathodoluminescence

Allalin 4027 Chronos - Quantitative Cathodoluminescence

The Allalin 4027 Chronos is the first dedicated cathodoluminescence solution offering a 10 picoseconds time resolution mode.
The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
The MProbe 40: MSP  Thin Film Measurement System

The MProbe 40: MSP Thin Film Measurement System

he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
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Material Science & Nanotechnology