ark NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and b...
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
Park NX-Bio enables that with its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM) and its highly acclaimed Atomic Force Microscopy (AFM) technology.
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
The Phenom Pro is Phenom-World's high-end imaging desktop SEM. In combination with a large range of sample holders and automated system software, it can be tailored to suit a multitude of applications.
The STA PT1600 is the high end Simultaneous Thermobalance from LINSEIS. The system offers unparalleled TG and DSC resolution in combination with the highest vacuum capabilities and TG drift stability. The system is modular with ma...
The Linseis LFA 1000 Laser Flash is the most modular and precise Instrument for the determination of Thermal Diffusivity, Conductivity and Specific Heat Values. Its sample robot for up to 6 Samples at the same time allows unbeaten...
The Grammont 2172 is a nanometer resolution spectroscopy instrument, based on a disruptive technology called Quantitative Cathodoluminescence, that tightly integrates a scanning electron microscope and a light microscope into one ...
The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…