All Products of Material Characterisation

TF Lab 4040 - Non-contact Sheet Resistivity Meter

TF Lab 4040 - Non-contact Sheet Resistivity Meter

The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin fil...
BI-200SM Research Goniometer and Laser Light Scattering System

BI-200SM Research Goniometer and Laser Light Scattering System

With a Brookhaven Instruments BI-200SM Research Goniometer System this rich field of exploration is open to you for studies of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).
BI-DCP Particle Size Analyzer Disc Centrifuge

BI-DCP Particle Size Analyzer Disc Centrifuge

The Brookhaven BI-DCP is a digitally controlled, high resolution, particle size distribution analyzer. It yields high resolution results in the size range from 0.01 to 30 microns with typical analysis times ranging from 5 to 30 mi...
BI-MwA Molecular Weight Analyzer

BI-MwA Molecular Weight Analyzer

The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-cont...
Solar simulators

Solar simulators

infinityPV ApS offers a broad range of solar simulator systems from the low cost laboratory work horse ISOSun that runs 24/7 in the lab, through high power lamps to advanced solar concentrators to industrial R2R solar simulators. ...
Source/Sink measure unit (SMU)

Source/Sink measure unit (SMU)

infinityPV ApS offers a versatile range of source measure units (SMUs) enabling testing of many solar cells in the same setup (from 1 to 40 channels) using a unique series multiplexers (MUXs) that cover from low voltage to high vo...
Active Load

Active Load

Active load combined with an infinityPV SMU and infinityPV software allow you to measure and keep photovoltaic devices at the maximum power point during operation (MPPT). The initial values at the MPP are obtained from a user pred...
Sample Holder

Sample Holder

Custom made sample holders The substrate and substrate layout is often a careful choice by scientists studying and developing novel PV technology. Whereas the holder and its mechanics can be the same. infinityPV now offer custom m...
CalCell reference device

CalCell reference device

infinityPV ApS offers the CalCell reference device which is a calibrated photodiode with filter that you can use to calibrate the intensity of you solar simulator at the position of your device under test. The infinityPV ISOSun so...
infinityPV Professional LBIC

infinityPV Professional LBIC

The infinityPV Professional LBIC desktop system enables fast high resolution mapping of the photovoltaic response over large areas. Ultrafast laser beam induced current (LBIC) mapping is carried out with a laser spot having a diam...
EddyCus TF Lab 4040SR Sheet Resistance Tester

EddyCus TF Lab 4040SR Sheet Resistance Tester

Non-contact sheet resistance and layer thickness measurement device The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device all...
EddyCus TF lab 2020SR Sheet Resistance Tester

EddyCus TF lab 2020SR Sheet Resistance Tester

Non-contact sheet resistance and layer thickness measurement device for single point measurements The EddyCus TF lab 2020 allows manual single point measurements of conductive thin films and layer thickness measurement of thin m...
Eddy­Cus TF map 2525SR

Eddy­Cus TF map 2525SR

Non-contact sheet resistance mapping The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode. Upon manu­al sample po­s­i...
EddyCus TF inline series

EddyCus TF inline series

Non-contact sheet resistance and layer thickness measurement solutions for process control The EddyCus TF inline series measures layer properties such as metal layer thickness or sheet resistance in non-contact on various substr...
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Material Science & Nanotechnology