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Park Systems
NX BIO - Atomic Force Microscope
Park NX-Bio enables that with its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM) and its highly acclaimed Atomic Force Microscopy (AFM) technology.
NX-Wafer - Atomic Force Microscope
Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
002-000 NX20 Complete AFM System
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
010-0020 NX10 Complete AFM System
ark NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and b...
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