Park FX40 - Atomic Force Microscope

Park Systems Park FX40

One Nanostep for Microscopy

One Giant Leap for Science?Sail Through your Research and Development

The first dual-camera system ever adopted in research AFM

Machine learning automation with updatable data

AI Robotics Technology

With the simple click of a button, Park FX40 automatically changes and replaces its own tips

Automatic Probe Pairing to Sample Locations

Sample Camera with storage capacity for up to four different samples simultaneously on the chuck, the sample camera effortlessly locates the most relevant spot for scanning

Auto Probe Exchange: Replace old probes easily and safely in full automation.

Auto Probe Reading: The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe enables you to select the best probe tip for each job.

Auto Beam Alignment: It shifts the X, Y and Z axis for clearer images, with no distortion, at the click of a button.