Park FX40 - Atomic Force Microscope

Effortlessly, get the sharpest, clearest, highest resolution images and measurements one sample after another on various applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 autonomously images and acquires data powered by its artificial intelligence, robotics and machine learning capability.

One Nanostep for Microscopy

One Giant Leap for Science?Sail Through your Research and Development

The first dual-camera system ever adopted in research AFM

Machine learning automation with updatable data

AI Robotics Technology

With the simple click of a button, Park FX40 automatically changes and replaces its own tips

Automatic Probe Pairing to Sample Locations

Sample Camera with storage capacity for up to four different samples simultaneously on the chuck, the sample camera effortlessly locates the most relevant spot for scanning

Auto Probe Exchange: Replace old probes easily and safely in full automation.

Auto Probe Reading: The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe enables you to select the best probe tip for each job.

Auto Beam Alignment: It shifts the X, Y and Z axis for clearer images, with no distortion, at the click of a button.

Specifications

XY Scanner
Structure

• Single-module, parallel-kinematic 2D flexure scanner
• Better symmetry than serial-kinematic flexure scanner

XY scan range

100 µm x 100 µm

Z Scanner
Structure

• Flexure-guided high-force scanner
• Better symmetry than serial-kinematic flexure scanner

Z scan range

15 µm

Sample mount
Mounting

• Magnetic holder (Max. 4 sample disc)
• FX Snap-in Sample Disk for Multi Snap-in Sample Chuck

Stages
Z stage travel range

22 mm (Motorized)

Visions and optics
Vision path

• On-axis sample view from top
• The same view as an optical microscope

CCD

• 5.1 M Pixel
• Pixel size: 3.45 μm x 3.45 μm

AFM Controller
Lock-in amp

4 channels integrated DC - 5 MHz

Accessories
Probe exchange

Probe exchange in less than 1 minutes using Automated Probe Exchange
(No need to remove head to exchange cantilevers)

Probe mount

Pre-aligned mount using chip carrier