Material Science & Nanotechnology

Back

Non-contact Sheet Resistivity Meter

TF Lab 4040 - Non-contact Sheet Resistivity Meter

The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin films and the thickness of metal layers. Most common applications include the measurement of thin conductive layers, doped wafers and conductive polymers.

Pricing & Availability Download Catalogue Add to wishlist

Add to Cart Contact Us for better pricing. Warranty Details

Free delivery within Singapore only

Advantages

Contactless measurement (real-time)
Precise measurement of conductive thin films on large substrates
Metal layer thickness measurement (nm)
Depiction of hidden and encapsulated conductive layers
Measurement results are storable

Measurement characteristics

Sheet resistance testing
Thickness measurement of metal layers
Single point measurement
Quality assurance
Sample sizes: 10 x 10 mm² to 400 x 400 mm² (0.5 x 0.5 inches to 16 x 16 inches)
Measurement range: 0.001 to 3,000 Ohm/sq

Applications

Coated architectural glass, e.g. LowE
Displays, touch screens and flat panel displays
OLED and LED applications
Smart glass
Graphene layers
Photovoltaic wafers and cells
Semiconductor wafers
Metallization layers and wafer metallization
De-icing and heating applications
Battery electrodes
Conductively coated paper and conductive textiles

No specifications found...

No downloads found...

Images coming soon...

No publications found...

Images coming soon...

https://www.suragus.com/media/filer_public/fe/86/fe868ff8-6227-4dac-a9a4-4fe18b323bfb/non-contact_sheet_resistance_measurement_device_suragus_eddycus_tf_lab_4040.mp4

* Name :

* Company :

* Department :

* Designation :

* Contact Number :

* Email :

Product :

* Enquiry :

Back to product list