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Material Science & Nanotechnology
All Products of Material Characterisation
EddyCus TF inline series
Non-contact sheet resistance and layer thickness measurement solutions for process control
The EddyCus TF inline series measures layer properties such as metal layer thickness or sheet resistance in non-contact on various substr...
EddyCus TF Portable 1010SR Series
Handheld device for sheet resistance measurement
The EddyCus TF portable is a handy and portable measurement device for fast contact measurement of large glasses and foils in production or in the field, for example for quick qua...
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Material Science & Nanotechnology
- Surface Treatment
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- Portable Solar Simulator
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- Atomic Force Microscope
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- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
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- Industrial/Online Colour Measurement
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- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
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- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
- Tribometers
- Indentation and Scratch Testers
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