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Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them.
Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX system.
A versatile microscopy platform for analytical chemistry researchers and shared user facilities
The most affordable AFM system for water measurement and analysis with latest NX performance
