Material Characterisation

Non-contact sheet resistance and layer thickness measurement device for single point measurements The EddyCus TF lab 2020 allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode. The compact bench-top device is ideal for fast and accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches). In addition to the measurement of thin conductive layers also doped wafers and conductive polymers can be analyzed.

Non-contact sheet resistance and layer thickness measurement device The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin films and the thickness of metal layers. Most common applications include the measurement of thin conductive layers, doped wafers and conductive polymers.

Handheld device for sheet resistance measurement The EddyCus TF portable is a handy and portable measurement device for fast contact measurement of large glasses and foils in production or in the field, for example for quick quality checks after manufacturing or as incoming good inspection. The handheld device allows the measurement even of hidden and encapsulated layers. It is an easy-to-use device that is controlled via a touch display.