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Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
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Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
Thermoelectrics
3D Optical Microscopes
Active Loads
Active Vibration Isolation System
AFM Image Analytics Software
Air Jet Erosion Tester
Atomic Force Microscope
BI-DCP Particle Size Analyzer
CalCell
CMP Tester
Densitometer
Dipping Probes
Flow Imaging Microscopy
Fretting Tester
Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
Gravimetric Sorption Analyzer
Hybridized SEM – Spectroscopic Platform (FA CL SEM)
Imaging Ellipsometer
Indentation and Scratch Testers
Industrial/Online Colour Measurement
Laser Flash Apparatus
LBIC
Light Collection / Injection for STEM (CL STEM Add-On)
Microscope Thin Films Measurement System
Molecular Weight Analyser
Nanoscale Infrared Spectroscopy
Non-contact Sheet Resistivity Meter
Particle Size and Zeta Potential Analyzer
Photomask Repair System
Research Goniometer and Laser Light Scattering System
Sample Holders
Scanning Electron Microscope (SEM)
Seeback Coefficient & Electric Resistivity Unit
Sheet Resistance Inline Systems
Sheet Resistance Mapper
Sheet Resistance Tester
Simultaneous Thermal Analyser
SMU Systems
Software
Solar Simulators
Spectrophotometer
Thermal Interface Material Tester
Thin Film Analyzer
Thin Film Thickness Measurement System
Tribometers
Säntis 300 - Full Wafer Cathodoluminescence Microscope
The Säntis 300 system has been designed for fully automated control of 150, 200 and 300mm wafers.
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