Material Characterisation

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX system.

The premiere choice for nanotechnology research

A versatile microscopy platform for analytical chemistry researchers and shared user facilities

Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them.

The most affordable AFM system for water measurement and analysis with latest NX performance

The affordable choice for the first step AFM research with the latest NX components

Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%

The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.

This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.