Material Characterisation

A flexible vertical range, high accuracy across roller stages, and a rigid design make the UP-2000 WLI microscopes an ideal choice for measuring roughness, step height, film thickness, and topography analysis of any sample.

The 3D optical profilometer UP-3000’s technology, performance, high accuracy, resolution, and versatility creates a class of its own. Equipped with fast scanning and high resolution, it offers the best solution for surface profiling.

The optical profilometer UP-5000’s technology, performance, resolution, and versatility creates a class of its own. Equipped with fast scanning, multiple imaging techniques and high resolution, the UP-5000 offers the best solution for large sample surface imaging.