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SA-AFM - Atomic Force Microscope
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Features
| Open Frame Design | Any sized sample can be scanned |
| Includes bottom plate | Allows for scanning small samples |
| Probe Exchange Tool Included | Reduce time for probe exchange |
| Includes top view video microscope | Facilitates tip approach and laser alignment |
| Includes vibrating, non-vibrating, phase, LFM, and advanced F/D | Most common scanning modes included for many applications |
| Flexible Sample holder | Can be used with most commercially available probes |
| Labview software with USB communication | Readily adaptable to new operating systems |
