Scanning Electron Microscope (SEM)

Key Features

The Phenom Pro Desktop SEM can be used to relieve the burden of routine analysis for common samples from floor-model SEM instruments. Instrument configuration and the sample loading mechanism ensure quick imaging with minimal time spent tuning between experiments.

Facility users of any experience level can quickly begin producing high-quality results with the Phenom Pro Desktop SEM. Its long-lifetime CeB₆ source offers high brightness while requiring low maintenance.

It's high stability and small form factor allow the instrument to be used in practically any lab environment; more simply put, it does not require specialized infrastructure or expert oversight.

 

Specifications

Light optical magnification	27–160x
Electron optical magnification range	160-350,000x
Resolution	≤ 6 nm SED and ≤ 8 nm BSD
Digital zoom	Max. 12x
Light optical navigation camera	Color
Acceleration voltages	Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum modes	High vacuum mode Charge reduction mode via optional low vacuum sample holder
Detector	Backscattered electron detector (standard) Energy-dispersive X-ray detector (standard) Secondary electron detector (optional)
Sample size	Up to 25 mm diameter (optional 32 mm)
Sample height	Up to 35 mm (optional 100 mm)