Atomic Force Microscope

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Park NX12 - Atomic Force Microscope

A versatile microscopy platform for analytical chemistry researchers and shared user facilities

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Overview

  • Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
  • Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
  • Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration

 

Proven Park NX10 performance Equipped with Inverted Optical Microscopy

Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables the study of electrochemical properties in samples that are transparent, opaque, soft or hard.

 

The perfect platform for fundamental electrochemistry

The study of the electrochemistry of batteries, fuel cells, sensors, and corrosion is a rapidly growing field, yet many AFMs do not directly address their unique needs. Park NX12 offers the functionality and flexibility chemistry researchers require by giving them one simple, easy-to-use platform with all the tools they need, including:

  • Versatile and easy-to-use electrochemistry cells
  • Environmental control options for inert gas and humidity
  • Inverted optical microscope (IOM)
  • Bi-potentiostat compatibility

 

Researchers can utilize the Park NX12 platform for various electrochemical applications:

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Electrochemical Cell Microscopy (SECCM)
  • Electrochemical Atomic Force Microscopy (EC-AFM)

 

Easy optical access with motorized focus stage

  • The system allows for top, side, and bottom optical access to the probe from various angles during measurements. This broad optical access combined with the device’s modular design also allows for optical or nano-optical add-ons.

 

Technical Info

Built with multi-user facilities in mind

Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM and optical imaging, making it one of the most flexible AFMs available.

 

A modular platform for shared user facilities

  The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared use facilities.

  It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.

  The Park NX12 is easy to use for pipette based SPM techniques with broad visual optical access to the scanning probe.

  The Park NX12’s reasonable price and unparalleled accuracy makes it the ideal platform for multi-user facilities as well as early career researchers.

 

Multiple Applications

The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

 

NX12-pinpointNX12-SICM

 

NX12-FD

 

Comprehensive force spectroscopy solution

The Park NX12 provides a complete package for nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.

 

Specifications

Scanner

Z Scanner

Guided high-force flexure scanner

Scan range : 15 µm (optional 30 µm)
Height noise level : 30 pm
(RMS, at 0.5 kHz bandwidth)

 

XY Scanner

Single module flexure XY-scanner with closed-loop control

Scan range : 100 µm × 100 µm

 

Stage

Z stage range : 25 mm (Motorized)
Focus travel range : 15 mm (Motorized)
XY stage travel range : 10 mm x 10 mm (Motorized)

 

Sample Mount

Sample size :   Open space up to 50 mm x 50 mm, thickness up to 20 mm (Sample size less than 40 x 40 mm recommended using SPM modes)
Sample weight : < 500 g

 

Optics

10x (0.23 NA) ultra-long working distance lens (1 µm resolution)
Direct on-axis vision of sample surface and cantilever
Field-of-view : 840 × 630 µm (with 10× objective lens)
CCD : 5 M Pixel, 1.2 M Pixel (optional)

 

Software

SmartScan™

Dedicated system control and data acquisition software
Adjusting feedback parameters in real time
Script-level control through external programs (optional)

XEI

AFM data analysis software

 

Electronics

Integrated functions
4 channels of flexible digital lock-in amplifier
Spring constant calibration (Thermal method, optional)
Digital Q control

 

AFM Modes
(*Optionally available)

Standard Imaging

True Non-Contact AFM
PinPoint™ AFM
Basic Contact AFM
Lateral Force Microscopy (LFM)
Phase Imaging
Tapping AFM

 

Force Measurement

Force Distance (F/d) Spectroscopy
Force Volume Imaging

 

Dielectric/Piezoelectric Properties*

Electric Force Microscopy (EFM)
Dynamic Contact EFM (EFM-DC)
Piezoresponse Force Microscopy (PFM)
PFM with High Voltage

 

Mechanical Properties

Force Modulation Microscopy (FMM)
Nanoindentation*
Nanolithography*
Nanolithography with High Voltage*
Nanomanipulation*

 

Magnetic Properties*

Magnetic Force Microscopy (MFM)
Tunable Magnetic Field MFM

 

Electrical Properties

Conductive AFM (C-AFM)*
IV Spectroscopy*
Kelvin Probe Force Microscopy (KPFM)
Scanning Capacitance Microscopy (SCM)*
Scanning Spreading-Resistance Microscopy (SSRM)*
Scanning Tunneling Microscopy (STM)*
Photo Current Mapping (PCM)*

 

Chemical Properties*

Chemical Force Microscopy with Functionalized Tip
Electrochemical Microscopy (EC-AFM)

 

AFM Options

Electrochemistry cells

Electrochemistry cell
Electrochemistry toolkit for universal liquid cell

 

Z Scanner Heads

15 μm Z Scanner AFM head
30 μm Z Scanner AFM head
15 μm Z Scanner SICM module
30 μm Z Scanner SICM module

 

Electrochemistry options

Potentiostat
Bipotentiostat

 

Environmental Control Options

Glovebox
Live cell chamber

 

Temperature Control

Temperature Controlled Stage 1
  -25 °C to +170 °C
Temperature Controlled Stage 2
  Ambient to +250 °C
Temperature Controlled Stage 3
  Ambient to +600 °C

 

Liquid Cells

Universal Liquid Cell: Open or closed liquid cell with liquid/gas perfusion Temperature control range: 0 °C to +110 °C (in air), 4 °C to +70 °C (with liquid)
Electrochemistry Cell
Open Liquid Cell

 

Liquid Probehand

Designed for imaging in general liquid environment
Resistant to most buffer solutions including acid
Contact and Non-contact AFM imaging in liquid

 

Magnetic Field Generator

Applies external magnetic field parallel to sample surface
Tunable magnetic field
Range : -300 ~ 300 gauss
Composed of pure iron core & two solenoid coils

 

Acoustic Enclosure

Stand alone type AE 204

 

Starter kits for advanced modes

Easy to use for advanced modes Includes specialized probes and samples