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NP-AFM - Atomic Force Microscope
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
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Features
| High Resolution Video Microscope | Readily locate Features for Scanning |
| Multiple Sample Stage or Vacuum Chuck | Optimized for specific technical samples |
| Closed Loop XY scanner | Great accuracy with rapid zoom to feature |
| Probe Exchange Tool | Reduce time for probe exchange |
| In plane flexure XY scanner | Minimal out of plane motion in images |
| Labview software with USB communication | Readily adaptable to new operating systems |
| Uses Industry standard probes | Probes for specific measurements are readily available. |
| Includes Vibrating, Non-Vibrating modes | Turnkey system |
