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EddyCus TF map 2525SR
Non-contact sheet resistance mapping The EddyCus TF map 2525SR automatically measures the sheet resistance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-contact mode. Upon manual sample positioning the device automatically measures and displays an accurate mapping of the sheet resistance across the entire sample area. The measurement settings allow easily and flexibly to choose between fast measurement times of below 1 minute or high spatial measurement resolution of more than 100,000 measurement points.
WhatsappOverview
Advantages
- Non-contact real time measurement of substrates up to 250 x 250 m² (10 x 10 inches)
- High resolution mapping of conductive thin films
- Characterization even of hidden and encapsulated conductive layers
- Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis)
- Measurement data saving and export functions
Measurement characteristics
- Sheet resistance
- Thin layer uniformity control
- Defect detection and coating analysis
- Measurement and mapping of metal layer thickness
- Quality control, input and output control
- Sample sizes: 50 x 50 mm² to 250 x 250 mm² (2 x 2 inches to 10 x 10 inches)
- Measurement range: 0.001 to 1,000 Ohm/sq
Applications
- Coated architectural glass, e.g. LowE
- Displays, touch screens and flat panel displays
- OLED and LED applications
- Smart glass
- Graphene layers
- Photovoltaic wafers and cells
- Semiconductor wafers
- Metallization layers and wafer metallization
- De-icing and heating applications
- Battery electrodes
- Conductively coated paper and conductive textiles
