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EddyCus TF Lab 4040SR Sheet Resistance Tester
Non-contact sheet resistance and layer thickness measurement device The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin films and the thickness of metal layers. Most common applications include the measurement of thin conductive layers, doped wafers and conductive polymers.
WhatsappOverview
Advantages
- Contactless measurement (real-time)
- Precise measurement of conductive thin films on large substrates
- Metal layer thickness measurement (nm)
- Depiction of hidden and encapsulated conductive layers
- Measurement results are storable
Measurement characteristics
- Sheet resistance testing
- Thickness measurement of metal layers
- Single point measurement
- Quality assurance
- Sample sizes: 10 x 10 mm² to 400 x 400 mm² (0.5 x 0.5 inches to 16 x 16 inches)
- Measurement range: 0.001 to 3,000 Ohm/sq
Applications
- Coated architectural glass, e.g. LowE
- Displays, touch screens and flat panel displays
- OLED and LED applications
- Smart glass
- Graphene layers
- Photovoltaic wafers and cells
- Semiconductor wafers
- Metallization layers and wafer metallization
- De-icing and heating applications
- Battery electrodes
- Conductively coated paper and conductive textiles
