AOTF-NIR Spectrometer (In-line Process)

The Luminar 4020 AOTF-NIR Thin-Film Spectrometer was designed to measure multiple layers of thin films individually and to eliminate the need to measure thickness of substrate for accurate coating weight. Coating weight of adhesive and residual solvent are routinely measured with this high-speed on-line analyzer, which can either be mounted on a traveler and scan across the web or measures statically.

Brimrose Luminar systems are non-contact solid state sensors with a compact, rugged design, providing rapid full spectrum scanning for demanding industrial use. The integrated Luminar 4020 is totally insensitive to ambient light, immune to vibration, dust, and dirt, which eases installation requirements in the production environment. An optical design eliminates the interference fringes making the measurement of thin films now possible using this on-line spectrometer.

 

Applications

Measurements of chemical compositions

• Film thickness and film coating potentially to the micron level
• Coating Material: acrylic, epoxy phenolic,epoxy-urea, multi-layer films and tapes, nitrocellulose, polyesters, etc.
• Film thickness and residual solvents measured in-line
• Measurement of coating thickness of organic lacquer or lubricant on metallic foils